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Gap States at the Interface of Ultra-Thin Oxide and Organic Films on Si(100)

Journal Solid State Phenomena (Volumes 76 - 77)
Volume Ultra Clean Processing of Silicon Surfaces V
Edited by Marc Heyns, Marc Meuris and Paul Mertens
Pages 131-134
DOI 10.4028/www.scientific.net/SSP.76-77.131
Citation T. Bitzer et al., 2001, Solid State Phenomena, 76-77, 131
Authors T. Bitzer, T. Rada, N.V. Richardson, T. Dittrich, F. Koch
Keywords Gap States, Organic Film/Silicon Interface, Ultra-Thin Oxide
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