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Modification of Low-K SiCOH Film Porosity by a HF Solution

Journal Solid State Phenomena (Volumes 76 - 77)
Volume Ultra Clean Processing of Silicon Surfaces V
Edited by Marc Heyns, Marc Meuris and Paul Mertens
Pages 135-138
DOI 10.4028/www.scientific.net/SSP.76-77.135
Citation Denis Shamiryan et al., 2001, Solid State Phenomena, 76-77, 135
Authors Denis Shamiryan, Mikhail R. Baklanov, Guy Vereecke, Serge Vanhaelemeersch, Karen Maex
Keywords Low-K Material, Porosity
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