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Dual Gate Oxide for 0.18μm Technologies and Below: Optimization of the Wet Processing Sequence

Journal Solid State Phenomena (Volumes 76 - 77)
Volume Ultra Clean Processing of Silicon Surfaces
Edited by Marc Heyns, Marc Meuris and Paul Mertens
Pages 27-30
DOI 10.4028/www.scientific.net/SSP.76-77.27
Authors Didier Lévy, Sébastien Petitdidier, H. Bernard, F. Guyader, C. Dezauzier, C. Pizzetti
Keywords Dual Gate Oxide, Overetch, Wet Cleaning
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