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Effect of Copper on the Breakthrough Voltage of Poly-Si - Poly-Si Capacitors

Journal Solid State Phenomena (Volumes 76 - 77)
Volume Ultra Clean Processing of Silicon Surfaces V
Edited by Marc Heyns, Marc Meuris and Paul Mertens
Pages 279-282
DOI 10.4028/www.scientific.net/SSP.76-77.279
Citation M. Boehringer et al., 2001, Solid State Phenomena, 76-77, 279
Authors M. Boehringer, J.E. Pillion, V. Erdmann, M. Rygula, K. Winz, P. Brauchle, D. Aquino, H. Zhang, Joseph Zahka, G. Zielonka, J. Hauber
Keywords Copper (Cu), Hydrofluoric Acid (HF), Poly-Silicon
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