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Improved Phosphoric Acid Mixtures for Nitride Strip

Journal Solid State Phenomena (Volumes 76 - 77)
Volume Ultra Clean Processing of Silicon Surfaces V
Edited by Marc Heyns, Marc Meuris and Paul Mertens
Pages 43-46
DOI 10.4028/www.scientific.net/SSP.76-77.43
Citation Rita Vos et al., 2001, Solid State Phenomena, 76-77, 43
Authors Rita Vos, Marcel Lux, Thierry Conard, H. De Witte, Paul W. Mertens, Marc M. Heyns, Z. Hatcher
Keywords Nitride Etch Selectivity, Oxide Etch Selectivity, Particle Removal, Wafer Cleaning
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