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The Effect of Ion Implantation on the Metal Contamination of Silicon Surfaces in Aqueous Solution

Journal Solid State Phenomena (Volumes 76 - 77)
Volume Ultra Clean Processing of Silicon Surfaces V
Edited by Marc Heyns, Marc Meuris and Paul Mertens
Pages 7-8
DOI 10.4028/www.scientific.net/SSP.76-77.7
Citation Lee M. Loewenstein et al., 2001, Solid State Phenomena, 76-77, 7
Authors Lee M. Loewenstein, Paul W. Mertens, Marc M. Heyns
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