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Challenging the Spatial Resolution Limits of CL and EBIC

Journal Solid State Phenomena (Volumes 78 - 79)
Volume Beam Injection Assessment of Microstructures in Semiconductors
Edited by H. Tomokage and T. Sekiguchi
Pages 19-28
DOI 10.4028/www.scientific.net/SSP.78-79.19
Citation Carl E. Norman, 2001, Solid State Phenomena, 78-79, 19
Authors Carl E. Norman
Keywords Cathodoluminescence, CL, EBIC, Electron Beam Induced Current (EBIC), Scanning Electron Microscope (SEM), Spatial Resolution
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