Paper Title:
MC-IR-LST and TEM Combined Analysis of Defects in the OSF-Ring of Cz-Silicon Crystals
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 78-79)
Edited by
H. Tomokage and T. Sekiguchi
Pages
211-216
DOI
10.4028/www.scientific.net/SSP.78-79.211
Citation
C. Frigeri, M. Ma, T. Irisawa, T. Ogawa, "MC-IR-LST and TEM Combined Analysis of Defects in the OSF-Ring of Cz-Silicon Crystals", Solid State Phenomena, Vols. 78-79, pp. 211-216, 2001
Online since
April 2001
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