Paper Title:
Assessment of Radiation Induced Lattice Defects in Shallow Trench Isolation Diodes Irradiated by Neutron
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 78-79)
Edited by
H. Tomokage and T. Sekiguchi
Pages
357-366
DOI
10.4028/www.scientific.net/SSP.78-79.357
Citation
K. Kobayashi, H. Ohyama, K. Hayama, Y. Takami, E. Simoen, A. Poyai, C. Claeys, A. Mohammadzadeh, S. Kohiki, "Assessment of Radiation Induced Lattice Defects in Shallow Trench Isolation Diodes Irradiated by Neutron", Solid State Phenomena, Vols. 78-79, pp. 357-366, 2001
Online since
April 2001
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Price
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