Electrical Behaviour of Crystal Defects in Silicon Solar Cells |
| Journal |
Solid State Phenomena (Volumes 78 - 79) |
| Volume |
Beam Injection Assessment of Microstructures in Semiconductors |
| Edited by |
H. Tomokage and T. Sekiguchi |
| Pages |
39-48 |
| DOI |
10.4028/www.scientific.net/SSP.78-79.39 |
| Citation |
Martin Kittler et al., 2001, Solid State Phenomena, 78-79, 39 |
| Authors |
Martin Kittler, Winfried Seifert, O. Krüger |
| Keywords |
P-N Junction, Contamination, Defect, Dislocations, EBIC, Gettering, Hydrogenation, Multicrystalline Silicon, Recombination, SiPHER®, Solar Cell |
| Full Paper |
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