Paper Title:
Scanning Capacitance Microscopy on Semiconductor Materials
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 78-79)
Edited by
H. Tomokage and T. Sekiguchi
Pages
425-0
DOI
10.4028/www.scientific.net/SSP.78-79.425
Citation
V. Raineri, F. Giannazzo, "Scanning Capacitance Microscopy on Semiconductor Materials", Solid State Phenomena, Vols. 78-79, pp. 425-0, 2001
Online since
April 2001
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Price
$32.00
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