Paper Title:
Depth Profiling of the Recombination Activity of Defects Measured by Temperature-Dependent Cross-Sectional EBIC
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 78-79)
Edited by
H. Tomokage and T. Sekiguchi
Pages
65-72
DOI
10.4028/www.scientific.net/SSP.78-79.65
Citation
O.F. Vyvenko, O. Krüger, M. Kittler, "Depth Profiling of the Recombination Activity of Defects Measured by Temperature-Dependent Cross-Sectional EBIC", Solid State Phenomena, Vols. 78-79, pp. 65-72, 2001
Online since
April 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.