Reconstruction of Diffusion Length Distribution by the Modulated EBIC and OBIC |
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| Journal | Solid State Phenomena (Volumes 78 - 79) |
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| Volume | Beam Injection Assessment of Microstructures in Semiconductors |
| Edited by | H. Tomokage and T. Sekiguchi |
| Pages | 79-88 |
| DOI | 10.4028/www.scientific.net/SSP.78-79.79 |
| Citation | Eugene B. Yakimov, 2001, Solid State Phenomena, 78-79, 79 |
| Authors | Eugene B. Yakimov |
| Keywords | Depletion Region, Diffusion Length, Electron Beam Induced Current (EBIC), Modulation, Semiconductor |
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