Recombination Properties of Defects in Gallium Nitride |
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| Journal | Solid State Phenomena (Volumes 78 - 79) |
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| Volume | Beam Injection Assessment of Microstructures in Semiconductors |
| Edited by | H. Tomokage and T. Sekiguchi |
| Pages | 95-102 |
| DOI | 10.4028/www.scientific.net/SSP.78-79.95 |
| Authors | Antonio Castaldini, Anna Cavallini, L. Polenta, Giancarlo Salviati |
| Keywords | CL Analyses, Deep Levels, Defect, EBIC Analyses, Gallium Nitride, Photocurrent Persistence, Recombination Activity |
| Full Paper | 
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