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Beam Injection Assessment of Microstructures in Semiconductors

Solid State Phenomena Volumes 78 - 79

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• p341 Dose Rate Dependence of Ion-Induced-Damage in Si Evaluated by Spectroscopic Ellipsometry   [ 135 K ]
  Authors: Y. Murakami, H. Yamauchi, Taizoh Sadoh, A. Kenjo, Masanobu Miyao
• p345 Influence of Ion Beam Irradiation on Solid-Phase Regrowth of Amorphous Si on SiO₂   [ 142 K ]
  Authors: I. Tsunoda, T. Nagata, Taizoh Sadoh, A. Kenjo, Masanobu Miyao
• p349 Formation of Silicon Nanoclusters in Silicon Oxide Using an Electron Beam   [ 303 K ]
  Authors: M.V. Zamoryanskaya, V.I. Sokolov, Alla A. Sitnikova
• p357 Assessment of Radiation Induced Lattice Defects in Shallow Trench Isolation Diodes Irradiated by Neutron   [ 294 K ]
  Authors: K. Kobayashi, H. Ohyama, K. Hayama, Y. Takami, Eddy Simoen, A. Poyai, C. Claeys, A. Mohammadzadeh, S. Kohiki
• p367 Deep Levels in Bulk-ZnSe Grown by Bridgman Method   [ 303 K ]
  Authors: M. Yoneta, T. Kubo, K. Ohmori, K. Yoshino, M. Ohishi, H. Saito
• p377 Characterization of Defects in 6H-Type Epitaxially Grown Silicon Carbide Wafer by Cathodoluminescence Microscopy   [ 235 K ]
  Authors: Toshiyuki Isshiki, Hiroshi Saijo, Shigehiro Nishino, M. Shiojiri
• p381 The Relaxation of the ZnO Single Crystals (000-1) Surface   [ 300 K ]
  Authors: Hideyuki Maki, Noboru Ichinose, Naoki Ohashi, Hajime Haneda, Junzo Tanaka
• p387 TEM Observation of Barium Titanate Thin Films Consisting of Nano-Sized Single Crystals Prepared by Sol-Gel Processing   [ 268 K ]
  Authors: Y. Yamashita, N. Kurata, Makoto Kuwabara
• p395 The Investigation of Charge Transport Properties of SOI Semiconductor Devices Using a Heavy Ion Microbeam   [ 284 K ]
  Authors: Toshio Hirao, Jamie Steward Laird, H. Mori, S. Onoda, Hisayoshi Itoh
• p401 A System for Ultra-Fast Transient Ion and Pulsed Laser Current Microscopies as a Function of Temperature   [ 379 K ]
  Authors: Jamie Steward Laird, Toshio Hirao, S. Onoda, H. Mori, Hisayoshi Itoh
• p407 Visualization of Electron Beam Charge Storage and Thermal Release in Thin Insulating Layers   [ 215 K ]
  Authors: Hans Joachim Fitting, Th. Hingst, E. Schreiber
• p413 Development of an Ultra-Precision Positioner and its Applications   [ 286 K ]
  Authors: Yoshiya Egashira, Kouji Kosaka, Shinji Takada, Tetsuya Iwabuchi, Misawo Shibata, Keiichi Nagamoto, Hiroshi Kubota
• p419 Photoabsorption Spectroscopy on Nanometer Scale by Scanning Tunneling Microscopy   [ 407 K ]
  Authors: A. Hida, Y. Mera, Koji Maeda
• p425 Scanning Capacitance Microscopy on Semiconductor Materials   [ 599 K ]
  Authors: Vito Raineri, Filippo Giannazzo