Structural Effects in Ultra-Thin Iridium Silicide |
| Journal |
Solid State Phenomena (Volumes 80 - 81) |
| Volume |
Polycrystalline Semiconductors VI |
| Edited by |
O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner |
| Pages |
101-108 |
| DOI |
10.4028/www.scientific.net/SSP.80-81.101 |
| Citation |
U. Hörmann et al., 2001, Solid State Phenomena, 80-81, 101 |
| Authors |
U. Hörmann, T. Remmele, C. Schür, M. Albrecht, Horst P. Strunk, H. Grünleitner, M. Schulz |
| Keywords |
Electron Diffraction (ED), Epitaxial Stabilization, Iridium Silicide |
| Full Paper |
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