Paper Title:
Morphological Characterization of Polysilicon Films Laser-Annealed in Argon Ambient
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 80-81)
Edited by
O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner
Pages
175-180
DOI
10.4028/www.scientific.net/SSP.80-81.175
Citation
Y. Helen, G. Gautier, K. Mourgues, F. Raoult, T. Mohammed-Brahim, R. Rogel, O. Bonnaud, C. Prat, D. Lemoine, "Morphological Characterization of Polysilicon Films Laser-Annealed in Argon Ambient", Solid State Phenomena, Vols. 80-81, pp. 175-180, 2001
Online since
November 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.