Paper Title:
Raman Spectroscopy of Ultra-Heavily Doped Laser-Crystallized Polycrystalline Silicon Films
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 80-81)
Edited by
O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner
Pages
193-198
DOI
10.4028/www.scientific.net/SSP.80-81.193
Citation
N.H. Nickel, P. Lengsfeld, I. Sieber, "Raman Spectroscopy of Ultra-Heavily Doped Laser-Crystallized Polycrystalline Silicon Films", Solid State Phenomena, Vols. 80-81, pp. 193-198, 2001
Online since
November 2001
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Price
$32.00
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