Local Potential at Atomically Abrupt Oxide Grain Boundaries by Scanning Probe Microscopy |
| Journal |
Solid State Phenomena (Volumes 80 - 81) |
| Volume |
Polycrystalline Semiconductors VI |
| Edited by |
O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner |
| Pages |
33-46 |
| DOI |
10.4028/www.scientific.net/SSP.80-81.33 |
| Citation |
Dawn A. Bonnell et al., 2001, Solid State Phenomena, 80-81, 33 |
| Authors |
Dawn A. Bonnell, Sergei V. Kalinin |
| Keywords |
Electrostatic Force Microscopy, Grain Boundary, Oxide, Scanning Surface Potential Microscopy, Transport Property |
| Full Paper |
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