Local Potential at Atomically Abrupt Oxide Grain Boundaries by Scanning Probe Microscopy |
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| Journal | Solid State Phenomena (Volumes 80 - 81) |
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| Volume | Polycrystalline Semiconductors VI |
| Edited by | O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner |
| Pages | 33-46 |
| DOI | 10.4028/www.scientific.net/SSP.80-81.33 |
| Authors | Dawn A. Bonnell, Sergei V. Kalinin |
| Keywords | Electrostatic Force Microscopy, Grain Boundary, Oxide, Scanning Surface Potential Microscopy, Transport Properties |
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