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Local Potential at Atomically Abrupt Oxide Grain Boundaries by Scanning Probe Microscopy

Journal Solid State Phenomena (Volumes 80 - 81)
Volume Polycrystalline Semiconductors VI
Edited by O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner
Pages 33-46
DOI 10.4028/www.scientific.net/SSP.80-81.33
Citation Dawn A. Bonnell et al., 2001, Solid State Phenomena, 80-81, 33
Authors Dawn A. Bonnell, Sergei V. Kalinin
Keywords Electrostatic Force Microscopy, Grain Boundary, Oxide, Scanning Surface Potential Microscopy, Transport Property
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