Correlation between the Ageing and the Grain Size of Polysilicon Thin-Film Transistors |
| Journal |
Solid State Phenomena (Volumes 80 - 81) |
| Volume |
Polycrystalline Semiconductors VI |
| Edited by |
O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner |
| Pages |
343-348 |
| DOI |
10.4028/www.scientific.net/SSP.80-81.343 |
| Citation |
H. Toutah et al., 2001, Solid State Phenomena, 80-81, 343 |
| Authors |
H. Toutah, B. Tala-Ighil, J.F. Llibre, T. Mohammed-Brahim, Youri Helen, Gael Gautier, K. Mourgues, F. Raoult |
| Keywords |
Poly-Silicon, Reliability, Structure, Thin Film Transistor |
| Full Paper |
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