Paper Title:
Electrical and Noise Characterization of Large-Grain Polycrystalline Silicon Thin-Film Transistors
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 80-81)
Edited by
O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner
Pages
367-372
DOI
10.4028/www.scientific.net/SSP.80-81.367
Citation
F.V. Farmakis, D.M. Tsamados, J. Brini, G. Kamarinos, C.A. Dimitriadis, "Electrical and Noise Characterization of Large-Grain Polycrystalline Silicon Thin-Film Transistors", Solid State Phenomena, Vols. 80-81, pp. 367-372, 2001
Online since
November 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.