Mechanical Properties of Thin and Thick Polysilicon Films for Microsystem Applications
| Periodical | Solid State Phenomena (Volumes 80 - 81) |
|---|---|
| Main Theme | Polycrystalline Semiconductors VI |
| Edited by | O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner |
| Pages | 405-416 |
| DOI | 10.4028/www.scientific.net/SSP.80-81.405 |
| Citation | J.R. Morante, 2001, Solid State Phenomena, 80-81, 405 |
| Authors | J.R. Morante |
| Keywords | Mechanical Stress, Micromechanics, Microsystems, Stress Gradients |
| Price | US$ 28,- |