Paper Title:
Intra-Grain Defects - Limiting Factor for Low-Temperature Polycrystalline Silicon Films?
| Periodical | Solid State Phenomena (Volumes 80 - 81) |
|---|---|
| Main Theme | Polycrystalline Semiconductors VI |
| Edited by | O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner |
| Pages | 95-100 |
| DOI | 10.4028/www.scientific.net/SSP.80-81.95 |
| Citation | Thomas A. Wagner et al., 2001, Solid State Phenomena, 80-81, 95 |
| Authors | Thomas A. Wagner, L. Oberbeck, R.B. Bergmann, Jens Werner |
| Keywords | Deep-Level Transient Spectroscopy, Diffusion Length, Photoluminescence (PL), Silicon Thin Films |
| Price | US$ 28,- |
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