Paper Title:
On the Mechanism of Defect Suppression in Nitrogen-Doped Silicon Single Crystals
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
17-24
DOI
10.4028/www.scientific.net/SSP.82-84.17
Citation
W. von Ammon, R. Hölzl, J. Virbulis, E. Dornberger, R. Schmolke, D. Gräf, "On the Mechanism of Defect Suppression in Nitrogen-Doped Silicon Single Crystals", Solid State Phenomena, Vols. 82-84, pp. 17-24, 2002
Online since
November 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.