Paper Title:
Characterization of Interstitial-Related Bulk Defects in p- Silicon Substrates by Epitaxial Deposition
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
231-236
DOI
10.4028/www.scientific.net/SSP.82-84.231
Citation
R. Schmolke, W. Angelberger, W. von Ammon, H. Bender, "Characterization of Interstitial-Related Bulk Defects in p- Silicon Substrates by Epitaxial Deposition", Solid State Phenomena, Vols. 82-84, pp. 231-236, 2002
Online since
November 2001
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