Paper Title:
Monitoring of Defects in Thermal Oxides during Electrical Stress
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
237-242
DOI
10.4028/www.scientific.net/SSP.82-84.237
Citation
D. Caputo, F. Irrera, F. Palma, "Monitoring of Defects in Thermal Oxides during Electrical Stress", Solid State Phenomena, Vols. 82-84, pp. 237-242, 2002
Online since
November 2001
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Price
$32.00
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