Paper Title:
A Study of the Conversion of the VO to the VO2 Defect in Heat-Treated Silicon under Stress
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
249-254
DOI
10.4028/www.scientific.net/SSP.82-84.249
Citation
C. A. Londos, M. Potsidou, A. Misiuk, I.V. Antonova, "A Study of the Conversion of the VO to the VO2 Defect in Heat-Treated Silicon under Stress", Solid State Phenomena, Vols. 82-84, pp. 249-254, 2002
Online since
November 2001
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Price
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