Paper Title:
Recombination Lifetimes of Iron-Contaminated Silicon Wafers: Characterization Using a Single Set of Capture Cross-Sections
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
373-380
DOI
10.4028/www.scientific.net/SSP.82-84.373
Citation
M. Rommel, G. Zoth, M. Ullrich, H. Ryssel, "Recombination Lifetimes of Iron-Contaminated Silicon Wafers: Characterization Using a Single Set of Capture Cross-Sections", Solid State Phenomena, Vols. 82-84, pp. 373-380, 2002
Online since
November 2001
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