Paper Title:
Ultra Low-Level Ion Implantation Damage Detected by p-n Junctions Biased above Breakdown
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
431-440
DOI
10.4028/www.scientific.net/SSP.82-84.431
Citation
E. Sciacca, S. Lombardo, D. Patti, D. Sanfillippo, C. Di Franco, M. Ghioni, F. Zappa, E. Rimini, S. Cova, "Ultra Low-Level Ion Implantation Damage Detected by p-n Junctions Biased above Breakdown", Solid State Phenomena, Vols. 82-84, pp. 431-440, 2002
Online since
November 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.