Paper Title:
Radiation-Induced Electronic Defect Levels in High-Resistivity Si Detectors
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
441-446
DOI
10.4028/www.scientific.net/SSP.82-84.441
Citation
E. V. Monakhov, B.S. Avset, A. Hallén, B. G. Svensson, "Radiation-Induced Electronic Defect Levels in High-Resistivity Si Detectors", Solid State Phenomena, Vols. 82-84, pp. 441-446, 2002
Online since
November 2001
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