Paper Title:
Study of the Effect of Carrier Cross-Sections, on the Leakage Current of Irradiated Silicon Detectors, using the Exchange Charge Model
  Abstract

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Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
459-464
DOI
10.4028/www.scientific.net/SSP.82-84.459
Citation
S. Saramad, A. Moussavi-Zarandi, "Study of the Effect of Carrier Cross-Sections, on the Leakage Current of Irradiated Silicon Detectors, using the Exchange Charge Model", Solid State Phenomena, Vols. 82-84, pp. 459-464, 2002
Online since
November 2001
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