Paper Title:
Influence of Ge Content on Electrical Properties: Sheet Resistance and Hall Mobility in Ion Beam Synthesized Si1-xGex Alloy
  Abstract

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Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
557-564
DOI
10.4028/www.scientific.net/SSP.82-84.557
Citation
C. Cerrina, A. Nejim, Y. Wang, P.L.F. Hemment, "Influence of Ge Content on Electrical Properties: Sheet Resistance and Hall Mobility in Ion Beam Synthesized Si1-xGex Alloy", Solid State Phenomena, Vols. 82-84, pp. 557-564, 2002
Online since
November 2001
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Price
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