Paper Title:
Spectroscopic Characterisation of Erbium Impurity in Crystalline Silicon
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
657-662
DOI
10.4028/www.scientific.net/SSP.82-84.657
Citation
C.A.J. Ammerlaan, I. de Maat-Gersdorf, "Spectroscopic Characterisation of Erbium Impurity in Crystalline Silicon", Solid State Phenomena, Vols. 82-84, pp. 657-662, 2002
Online since
November 2001
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Price
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