Paper Title:
Lock-In IR-Thermography – A Novel Tool for Material and Device Characterization
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 82-84)
Edited by
V. Raineri, F. Priolo, M. Kittler and H. Richter
Pages
741-746
DOI
10.4028/www.scientific.net/SSP.82-84.741
Citation
S. Huth, O. Breitenstein, A. Huber, D. Dantz, U. Lambert, F. Altmann, "Lock-In IR-Thermography – A Novel Tool for Material and Device Characterization", Solid State Phenomena, Vols. 82-84, pp. 741-746, 2002
Online since
November 2001
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Price
$32.00
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