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Interaction of Point Defects with Dislocations in Silicon and Germanium: Electrical and Optical Effects

Journal Solid State Phenomena (Volumes 85 - 86)
Volume Defect Interaction and Clustering in Semiconductors
Edited by S. Pizzini
Pages 67-144
DOI 10.4028/www.scientific.net/SSP.85-86.67
Authors Wolfgang Schröter, Hans Cerva
Keywords Dangling Bond, Decoration, Dislocation, DLTS, EBIC, EPR, Luminescence, Reconstruction, Silicon Devices, Stacking Fault, Transmission Electron Microscopy (TEM)
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