Interaction of Point Defects with Dislocations in Silicon and Germanium: Electrical and Optical Effects |
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| Journal | Solid State Phenomena (Volumes 85 - 86) |
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| Volume | Defect Interaction and Clustering in Semiconductors |
| Edited by | S. Pizzini |
| Pages | 67-144 |
| DOI | 10.4028/www.scientific.net/SSP.85-86.67 |
| Authors | Wolfgang Schröter, Hans Cerva |
| Keywords | Dangling Bond, Decoration, Dislocation, DLTS, EBIC, EPR, Luminescence, Reconstruction, Silicon Devices, Stacking Fault, Transmission Electron Microscopy (TEM) |
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