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Investigating Post CMP Cleaning Processes for STI Ceria Slurries

Journal Solid State Phenomena (Volume 92)
Volume Ultra Clean Processing of Silicon Surfaces VI
Edited by Marc Heyns, Paul Mertens and Marc Meuris
Pages 63-68
DOI 10.4028/www.scientific.net/SSP.92.63
Citation Robert Small et al., 2003, Solid State Phenomena, 92, 63
Authors Robert Small, Pascal Berar, Brandon Scott
Keywords Buffered Chelating Solutions, Ceria Oxide Cleaning, Hydrogen Peroxide, Mass Transfer Effects
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