Effects of Grain Boundary Structure and Chemistry on Electrical Activity in Polycrystalline Silicon |
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| Journal | Solid State Phenomena (Volume 93) |
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| Volume | Polycrystalline Semiconductors VII |
| Edited by | T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner |
| Pages | 333-338 |
| DOI | 10.4028/www.scientific.net/SSP.93.333 |
| Authors | Sadahiro Tsurekawa, Tadao Watanabe |
| Keywords | Electrical Activity, Electron Beam Induced Current (EBIC), Grain Boundary, Passivation, Silicon |
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