Effects of Grain Boundary Structure and Chemistry on Electrical Activity in Polycrystalline Silicon |
|
| Journal | Solid State Phenomena (Volume 93) |
|---|---|
| Volume | Polycrystalline Semiconductors VII |
| Edited by | T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner |
| Pages | 333-338 |
| DOI | 10.4028/www.scientific.net/SSP.93.333 |
| Authors | Sadahiro Tsurekawa, Tadao Watanabe |
| Keywords | Electrical Activity, Electron Beam Induced Current (EBIC), Grain Boundary, Passivation, Silicon |
| Full Paper | 
Get the full paper by clicking here
|
First page example
