Effects of Grain Boundary Structure and Chemistry on Electrical Activity in Polycrystalline Silicon |
| Journal |
Solid State Phenomena (Volume 93) |
| Volume |
Polycrystalline Semiconductors VII |
| Edited by |
T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner |
| Pages |
333-338 |
| DOI |
10.4028/www.scientific.net/SSP.93.333 |
| Citation |
Sadahiro Tsurekawa et al., 2003, Solid State Phenomena, 93, 333 |
| Authors |
Sadahiro Tsurekawa, Tadao Watanabe |
| Keywords |
Electrical Activity, Electron Beam Induced Current (EBIC), Grain Boundary, Passivation, Silicon |
| Full Paper |
Get the full paper by clicking here
|
