Paper Title:
Effects of Oxidation and Annealing Temperature on Grain Boundary Properties in Polycrystalline Silicon Probed Using Nanometre-Scale Point-Contact Devices
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Periodical
Solid State Phenomena (Volume 93)
Edited by
T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner
Pages
345-350
DOI
10.4028/www.scientific.net/SSP.93.345
Citation
T. Kamiya, Y. Furuta, Y.-T. Tan, Z. A.K. Durrani, H. Mizuta, H. Ahmed, "Effects of Oxidation and Annealing Temperature on Grain Boundary Properties in Polycrystalline Silicon Probed Using Nanometre-Scale Point-Contact Devices", Solid State Phenomena, Vol. 93, pp. 345-350, 2003
Online since
June 2003
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