Reliability of Low-Temperature Poly-Si Thin-Film Transistors |
| Journal |
Solid State Phenomena (Volume 93) |
| Volume |
Polycrystalline Semiconductors VII |
| Edited by |
T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner |
| Pages |
43-48 |
| DOI |
10.4028/www.scientific.net/SSP.93.43 |
| Authors |
Y. Inoue,
H. Ogawa,
Takeshi Endo,
Hiroshi Yano,
Tomoaki Hatayama,
Yukiharu Uraoka,
Takashi Fuyuki
|
| Keywords |
Drain Avalanche, Dynamic Stress, Hot Carriers, Reliability, Thin Film Transistor |
| Full Paper |
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|
