Paper Title:
Reliability of Low-Temperature Poly-Si Thin-Film Transistors
  Abstract

  Info
Periodical
Solid State Phenomena (Volume 93)
Edited by
T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner
Pages
43-48
DOI
10.4028/www.scientific.net/SSP.93.43
Citation
Y. Inoue, H. Ogawa, T. Endo, H. Yano, T. Hatayama, Y. Uraoka, T. Fuyuki, "Reliability of Low-Temperature Poly-Si Thin-Film Transistors", Solid State Phenomena, Vol. 93, pp. 43-48, 2003
Online since
June 2003
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Price
$32.00
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