Reliability of Low-Temperature Poly-Si Thin-Film Transistors |
| Journal |
Solid State Phenomena (Volume 93) |
| Volume |
Polycrystalline Semiconductors VII |
| Edited by |
T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner |
| Pages |
43-48 |
| DOI |
10.4028/www.scientific.net/SSP.93.43 |
| Citation |
Y. Inoue et al., 2003, Solid State Phenomena, 93, 43 |
| Authors |
Y. Inoue, H. Ogawa, Takeshi Endo, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki |
| Keywords |
Drain Avalanche, Dynamic Stress, Hot Carriers, Reliability, Thin Film Transistor |
| Full Paper |
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