Paper Title:
Estimation of the Upper Limit of the Minority-Carrier Diffusion Length in Multicrystalline Silicon: Limitation of the Action of Gettering and Passivation on Dislocations
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Periodical
Solid State Phenomena (Volumes 95-96)
Edited by
H. Richter and M. Kittler
Pages
197-204
DOI
10.4028/www.scientific.net/SSP.95-96.197
Citation
M. Kittler, W. Seifert, "Estimation of the Upper Limit of the Minority-Carrier Diffusion Length in Multicrystalline Silicon: Limitation of the Action of Gettering and Passivation on Dislocations", Solid State Phenomena, Vols. 95-96, pp. 197-204, 2004
Online since
September 2003
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