Paper Title:
Carrier Density Imaging as a Tool for Characterising the Electrical Activity of Defects in Pre-Processed Multicrystalline Silicon
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Periodical
Solid State Phenomena (Volumes 95-96)
Edited by
H. Richter and M. Kittler
Pages
229-234
DOI
10.4028/www.scientific.net/SSP.95-96.229
Citation
S. Riepe, G. Stokkan, T. Kieliba, W. Warta, "Carrier Density Imaging as a Tool for Characterising the Electrical Activity of Defects in Pre-Processed Multicrystalline Silicon", Solid State Phenomena, Vols. 95-96, pp. 229-234, 2004
Online since
September 2003
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