Paper Title:
Impact of Defects on the Leakage Currents of Si/SiGe/Si Heterojunction Bipolar Transistors
| Periodical | Solid State Phenomena (Volumes 95 - 96) |
|---|---|
| Main Theme | Gettering and Defect Engineering in Semiconductor Technology X |
| Edited by | H. Richter and M. Kittler |
| Pages | 249-254 |
| DOI | 10.4028/www.scientific.net/SSP.95-96.249 |
| Citation | D. Wolansky et al., 2003, Solid State Phenomena, 95-96, 249 |
| Online since | September, 2003 |
| Authors | D. Wolansky, G.G. Fischer, D. Knoll, D. Bolze, Bernd Tillack, P. Schley, Y. Yamamoto |
| Keywords | Crystal Defects, Herojunction Bipolar Transistor (HBT), Leakage Current |
| Price | US$ 28,- |
View full size
