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Extended Defects in Silicon: an Old and New Story

Journal Solid State Phenomena (Volumes 95 - 96)
Volume Gettering and Defect Engineering in Semiconductor Technology X
Edited by H. Richter and M. Kittler
Pages 263-272
DOI 10.4028/www.scientific.net/SSP.95-96.263
Citation Jan Vanhellemont et al., 2003, Solid State Phenomena, 95-96, 263
Authors Jan Vanhellemont, Olivier De Gryse, Paul Clauws
Keywords Dislocations, Film Stresses, Local Oxidation, Oxygen Precipitation, Process, Silicon
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