Paper Title:
Influence of Cobalt Contamination in the Measurement of Diffusion Length of Silicon Wafers
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 95-96)
Edited by
H. Richter and M. Kittler
Pages
373-380
DOI
10.4028/www.scientific.net/SSP.95-96.373
Citation
N. Pic, A. Danel, M. L. Polignano, G. Salvà, M. Sardo, S. Rey, "Influence of Cobalt Contamination in the Measurement of Diffusion Length of Silicon Wafers", Solid State Phenomena, Vols. 95-96, pp. 373-380, 2004
Online since
September 2003
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Ana Vera Machado, Isabel Neves, Gabriela Botelho, P. Rebelo
Abstract:Commercial samples of high density polyethylene were decomposed over faujasites (FAU) type zeolites (Y-type) using thermal gravimetric...
901
Authors: Ryo Hattori, Tomokatsu Watanabe, T. Mitani, Hiroaki Sumitani, Tatsuo Oomori
Abstract:Crystalline recovery mechanism in the activation annealing process of Al implanted 4H-SiC crystals were experimentally investigated....
585
Authors: Jia Chun Zhong, Jian Yang, Hai Long Tang, Xiao Bo Liu
High Performance Elastomers & Polymers
Abstract:The kinetics of the thermal degradation of Polyarylene ether natriles (PEN) (crosslinked and uncrosslinked) were investigated by...
1917
Authors: Jung Ho Lee, Jung Jun Ahn, Anders Hallén, Carl Mikael Zetterling, Sang Mo Koo
Chapter 5: Processing of SiC
Abstract:In this work, local oxidation behavior in phosphorous ion-implanted 4H-SiC has been investigated by using atomic force microscopy (AFM). The...
905
Authors: De Qiang Chang, Jing Xian Liu, Ning Mao, Bao Zhi Chen
Chapter 4: Mechanics, Thermal and Dynamics Systems, Vibration, Noise, Applied Mechanics and Numerical Simulation Applications
Abstract:In order to study the thermal stability of PPS (polyphenylene sulfide) filter media, by means of thermogravimetry(TG), thermal degradation...
1171