Paper Title:
Microstructural and Electrical Properties of NiSi2 Precipitates at Dislocations in Silicon
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 95-96)
Edited by
H. Richter and M. Kittler
Pages
447-452
DOI
10.4028/www.scientific.net/SSP.95-96.447
Citation
M. Seibt, V. V. Kveder, " Microstructural and Electrical Properties of NiSi2 Precipitates at Dislocations in Silicon", Solid State Phenomena, Vols. 95-96, pp. 447-452, 2004
Online since
September 2003
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$32.00
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