Paper Title:
Capacitance-Transient Detection of X-Ray Absorption Fine Structure: A Possible Tool to Analyze the Structure of Deep-Level Centers?
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 95-96)
Edited by
H. Richter and M. Kittler
Pages
483-488
DOI
10.4028/www.scientific.net/SSP.95-96.483
Citation
J. Weber, J. Bollmann, S. Knack, V. Kotestki, H.E. Mahnke, E. Welter, "Capacitance-Transient Detection of X-Ray Absorption Fine Structure: A Possible Tool to Analyze the Structure of Deep-Level Centers?", Solid State Phenomena, Vols. 95-96, pp. 483-488, 2004
Online since
September 2003
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Price
$32.00
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