Paper Title:
Gold Diffusion as a Tool for Defect Characterization in Si
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 95-96)
Edited by
H. Richter and M. Kittler
Pages
495-500
DOI
10.4028/www.scientific.net/SSP.95-96.495
Citation
O. V. Feklisova, E. B. Yakimov, "Gold Diffusion as a Tool for Defect Characterization in Si", Solid State Phenomena, Vols. 95-96, pp. 495-500, 2004
Online since
September 2003
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