Paper Title:
Residual Stress Distribution and Silicon Phase Transformation Induced by Rockwell Indentation at Different Temperatures, Studied by Means of Micro-Raman Spectroscopy
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Periodical
Solid State Phenomena (Volumes 95-96)
Edited by
H. Richter and M. Kittler
Pages
513-518
DOI
10.4028/www.scientific.net/SSP.95-96.513
Citation
S. Kouteva-Arguirova, V. I. Orlov, W. Seifert, J. Reif, H. Richter, "Residual Stress Distribution and Silicon Phase Transformation Induced by Rockwell Indentation at Different Temperatures, Studied by Means of Micro-Raman Spectroscopy", Solid State Phenomena, Vols. 95-96, pp. 513-518, 2004
Online since
September 2003
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