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Gettering Strategies for SOI Wafers

Journal Solid State Phenomena (Volumes 95 - 96)
Volume Gettering and Defect Engineering in Semiconductor Technology X
Edited by H. Richter and M. Kittler
Pages 547-552
DOI 10.4028/www.scientific.net/SSP.95-96.547
Citation Andrei A. Istratov et al., 2003, Solid State Phenomena, 95-96, 547
Authors Andrei A. Istratov, W. Huber, Eicke R. Weber
Keywords Gettering, Iron, Poly-Silicon, Silicon Dioxide, SOI
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