Paper Title:
Investigations of the Effect of High Pressure on the Annealing Behavior of Oxygen Related Defects in Silicon
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Periodical
Solid State Phenomena (Volumes 95-96)
Edited by
H. Richter and M. Kittler
Pages
59-64
DOI
10.4028/www.scientific.net/SSP.95-96.59
Citation
C. A. Londos, M.S. Potsidi, A. Misiuk, J. Bak-Misiuk, A. Shalimov, V. V. Emtsev, "Investigations of the Effect of High Pressure on the Annealing Behavior of Oxygen Related Defects in Silicon ", Solid State Phenomena, Vols. 95-96, pp. 59-64, 2004
Online since
September 2003
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