Investigations of the Effect of High Pressure on the Annealing Behavior of Oxygen Related Defects in Silicon |
| Journal |
Solid State Phenomena (Volumes 95 - 96) |
| Volume |
Gettering and Defect Engineering in Semiconductor Technology X |
| Edited by |
H. Richter and M. Kittler |
| Pages |
59-64 |
| DOI |
10.4028/www.scientific.net/SSP.95-96.59 |
| Citation |
Charalamos A. Londos et al., 2003, Solid State Phenomena, 95-96, 59 |
| Authors |
Charalamos A. Londos, M.S. Potsidi, Andrzej Misiuk, Jadwiga Bak-Misiuk, Artem Shalimov, Valentin V. Emtsev |
| Keywords |
Hydrostatic Pressure, Neutron Irradiation Defects, Silicon |
| Full Paper |
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